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Site-Specific Plan-View Sample Preparation in the FIB

Published online by Cambridge University Press:  01 August 2010

S McKernan ,
Y Zhu  and
J Xie
S McKernan
Affiliation:
3M
Y Zhu
Affiliation:
3M
J Xie
Affiliation:
3M

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 228 - 229
Copyright
Copyright © Microscopy Society of America 2010