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Single Particle Analysis with Highly Coherent Electron Source from Cold Field Emission Gun

Published online by Cambridge University Press:  01 August 2018

Naoki Hosogi ,
Takuma Fukumura ,
Yuko Shimizu  and
Hirohumi Iijima
Naoki Hosogi
Affiliation:
EM Business Unit, JEOL Ltd., 3-1-2 Musashino Akishima, Tokyo196-8558Japan
Takuma Fukumura
Affiliation:
EM Business Unit, JEOL Ltd., 3-1-2 Musashino Akishima, Tokyo196-8558Japan
Yuko Shimizu
Affiliation:
EM Business Unit, JEOL Ltd., 3-1-2 Musashino Akishima, Tokyo196-8558Japan
Hirohumi Iijima
Affiliation:
EM Business Unit, JEOL Ltd., 3-1-2 Musashino Akishima, Tokyo196-8558Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1160 - 1161
Copyright
© Microscopy Society of America 2018 

References

[1] Callway, E Nature 525 2015) p. 172.Google Scholar
[2] Merk, A, et al, Cell 165 2016) p. 1698.Google Scholar