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Simultaneous Observations of Different Type Images in a Scanning Electron Microscope

Published online by Cambridge University Press:  01 August 2005

A Yamada ,
T Negishi ,
M Yamada ,
Y Tokiwa ,
H Ohashi  and
H Kazumori
A Yamada
Affiliation:
JEOL Ltd., Tokyo, Japan
T Negishi
Affiliation:
JEOL Ltd., Tokyo, Japan
M Yamada
Affiliation:
JEOL Ltd., Tokyo, Japan
Y Tokiwa
Affiliation:
JEOL Ltd., Tokyo, Japan
H Ohashi
Affiliation:
JEOL Ltd., Tokyo, Japan
H Kazumori
Affiliation:
JEOL Ltd., Tokyo, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 746 - 747
Copyright
© 2005 Microscopy Society of America