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Simultaneous Hard X-ray Ptychographic Tomography and X-ray Fluorescence Tomography of Isolated Hollow Core-Shell GaN Rods

Published online by Cambridge University Press:  10 August 2018

M. Kahnt ,
G. Falkenberg ,
J. Garrevoet ,
J. Hartmann ,
T. Krause ,
M. Niehle ,
M. Scholz ,
M. Seyrich ,
A. Trampert  and
A. Waag
...Show all authors
M. Kahnt*
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany University of Hamburg, Department Physik, Hamburg, Germany
G. Falkenberg
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany
J. Garrevoet
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany
J. Hartmann
Affiliation:
Institut fur Halbleitertechnik and Laboratory for Emerging Nanometrology, Technische Universitat Braunschweig, Braunschweig, Germany
T. Krause
Affiliation:
Paul-Drude-Institut fur Festkorperelektronik, Berlin, Germany
M. Niehle
Affiliation:
Paul-Drude-Institut fur Festkorperelektronik, Berlin, Germany
M. Scholz
Affiliation:
University of Hamburg, Department Physik, Hamburg, Germany
M. Seyrich
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany University of Hamburg, Department Physik, Hamburg, Germany
A. Trampert
Affiliation:
Paul-Drude-Institut fur Festkorperelektronik, Berlin, Germany
A. Waag
Affiliation:
Institut fur Halbleitertechnik and Laboratory for Emerging Nanometrology, Technische Universitat Braunschweig, Braunschweig, Germany
H.-H. Wehmann
Affiliation:
Institut fur Halbleitertechnik and Laboratory for Emerging Nanometrology, Technische Universitat Braunschweig, Braunschweig, Germany
F. Wittwer
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany University of Hamburg, Department Physik, Hamburg, Germany
H. Zhou
Affiliation:
Institut fur Halbleitertechnik and Laboratory for Emerging Nanometrology, Technische Universitat Braunschweig, Braunschweig, Germany
M. Hanke
Affiliation:
Paul-Drude-Institut fur Festkorperelektronik, Berlin, Germany
C. G. Schroer
Affiliation:
Deutsches Elektronen-Synchrotron, Hamburg, Germany University of Hamburg, Department Physik, Hamburg, Germany
*
* Corresponding author: maik.kahnt@desy.de

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 32 - 33
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Krause, T., et al., Phys. Rev. Applied 7, 024033 2017.Google Scholar
[2] Schroer, C. G., et al., Nucl. Instr. Meth. A 616(2-3), 93–97, 2010.Google Scholar
[3] Schroer, C. G., etal., Proc. of SPIE 10389, 1038901 2017.Google Scholar
[4] Maiden, A. M., et al., Ultramicroscopy 109, 1256–1262, 2009.Google Scholar
[5] Guizar-Sicairos, M., et al., Optics Express 19, 21345–21357, 2011.CrossRefGoogle Scholar
[6] Gursoy, D., et al., J Synchrotron Radiat 21, 1188–1193, 2014.CrossRefGoogle Scholar