Hostname: page-component-848d4c4894-xm8r8 Total loading time: 0 Render date: 2024-06-23T09:14:46.378Z Has data issue: false hasContentIssue false

A Simple Method to Estimate Local Absolute Thickness Using Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2018

Y. Yu
Affiliation:
National Energy Technology Laboratory, Pittsburgh, PA, USA AECOM, Pittsburgh, PA, USA
M. De Graef
Affiliation:
Department of Materials Science & Engineering, Carnegie Mellon University, Pittsburgh, PA, USA
P. R. Ohodnicki
Affiliation:
National Energy Technology Laboratory, Pittsburgh, PA, USA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Hartel, P., Rose, H. Dinges, C. Ultramicroscopy 63 1996) p. 93.Google Scholar
[2] Malis, T., Cheng, S. C. Egerton, R. F. J. Electron Microsc. Tech 8 1988) p. 193.Google Scholar
[3] This technical effort was performed in support of the National Energy Technology Laboratory’s solid oxide fuel cell research activity under the RES contract DE-FE0004000. The authors acknowledge use of the Materials Characterization Facility at Carnegie Mellon University supported by grant MCF-677785.Google Scholar