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Sharpening and Positioning of Regions of Interest in Atom Probe Samples using In-Situ Sputtering

Published online by Cambridge University Press:  21 July 2003

D. J. Larson ,
A. Cerezo ,
Y. Q. Ma ,
T. J. Godfrey ,
P. H. Clifton  and
G. D. W. Smith
D. J. Larson
Affiliation:
Recording Head Operations, Seagate Technology, Bloomington, MN 55435, USA
A. Cerezo
Affiliation:
Department of Materials, Oxford University, Oxford, UK OX13PH
Y. Q. Ma
Affiliation:
Department of Materials, Oxford University, Oxford, UK OX13PH
T. J. Godfrey
Affiliation:
Department of Materials, Oxford University, Oxford, UK OX13PH
P. H. Clifton
Affiliation:
Recording Head Operations, Seagate Technology, Bloomington, MN 55435, USA
G. D. W. Smith
Affiliation:
Department of Materials, Oxford University, Oxford, UK OX13PH

Abstract

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Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 578 - 579
Copyright
Copyright © Microscopy Society of America 2003