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Serial Thick Section Gas Cluster Ion Beam Scanning Electron Microscopy

Published online by Cambridge University Press:  01 August 2018

Kenneth J. Hayworth ,
David Peale ,
Zhiyuan Lu ,
C. Shan Xu  and
Harald F. Hess
Kenneth J. Hayworth
Affiliation:
Janelia Research Campus, Howard Hughes Medical Institute, Ashburn, United States.
David Peale
Affiliation:
Janelia Research Campus, Howard Hughes Medical Institute, Ashburn, United States.
Zhiyuan Lu
Affiliation:
Department of Psychology and Neuroscience, Dalhousie University, Halifax, Canada.
C. Shan Xu
Affiliation:
Janelia Research Campus, Howard Hughes Medical Institute, Ashburn, United States.
Harald F. Hess
Affiliation:
Janelia Research Campus, Howard Hughes Medical Institute, Ashburn, United States.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1444 - 1445
Copyright
© Microscopy Society of America 2018 

References

[1] Xu, CS, et al, Elife 6 2017) p. e25916.Google Scholar
[2] Keman, T, Garbowski, T Zeidler, D Proc. of SPIE 9658 2015) p. 965807–9658071.Google Scholar
[3] Yamada, I, et al, Mater. Sci. Eng. R Rep 34 2001) p. 231.Google Scholar
[4] Calcagno, L, Compagnini, G Foti, G Nucl. Instr. Meth. Phys. Res. B 65 1992) p. 413.Google Scholar
[5] Hayworth, KJ, et al, Nat. Methods 12 2015) p. 319.Google Scholar