Hostname: page-component-848d4c4894-xfwgj Total loading time: 0 Render date: 2024-07-03T01:49:18.842Z Has data issue: false hasContentIssue false
  • English
  • Français

Revealing the Origin of “Phonon Glass-Electron Crystal” Behavior in Thermoelectric Layered Cobaltate by Accurate Displacement Measurement

Published online by Cambridge University Press:  27 August 2014

L. Wu ,
Q. Meng ,
Ch. Jooss ,
J.-C. Zheng ,
H. Inada ,
D. Su ,
Q. Li  and
Y. Zhu
L. Wu
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973 USA
Q. Meng
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973 USA
Ch. Jooss
Affiliation:
University of Goettingen, Goettingen, Germany
J.-C. Zheng
Affiliation:
Xiamen University, Xiamen, China
H. Inada
Affiliation:
Hitachi High Technologies Corp., Ibaraki Japan
D. Su
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973 USA
Q. Li
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973 USA
Y. Zhu
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973 USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 434 - 435
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Wu, L., Meng, Q., Jooss, Ch., Zheng, J.-C., Inada, H., Su, D., Li, Q., and Zhu, Y. Adv. Funct. Mater. 23, 5728-5736 (2013).Google Scholar
[2] Work was supported by the U.S. DOE, Office of Basic Energy Science, Material Science and Engineering Division, under Contract No. DE-AC02-98CH10886.Google Scholar