Hostname: page-component-76fb5796d-skm99 Total loading time: 0 Render date: 2024-04-25T18:08:56.644Z Has data issue: false hasContentIssue false
  • English
  • Français

Report from the NIST-MAS Workshop on “The Accuracy Barrier in Quantitative EPMA and the Role of Standards”

Published online by Cambridge University Press:  21 July 2003

Dale Newbury ,
Ryna Marinenko ,
John Armstrong ,
John Small  and
Eric Steel
Dale Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899-837
Ryna Marinenko
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899-837
John Armstrong
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899-837
John Small
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899-837
Eric Steel
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899-837

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 528 - 529
Copyright
Copyright © Microscopy Society of America 2003