Hostname: page-component-848d4c4894-nmvwc Total loading time: 0 Render date: 2024-06-20T05:19:12.519Z Has data issue: false hasContentIssue false

Reducing Decoherence in Fluctuation Electron Microscopy

Published online by Cambridge University Press:  30 July 2021

Armin Zjajo
Affiliation:
Arizona State University, Phoenix, Arizona, United States
Itai Matzkevich
Affiliation:
Arizona State University, United States
Hongchu Du
Affiliation:
Forschungszentrum Juelich GmbH, United States
Rafal Dunin-Borkowski
Affiliation:
Forchungszentrum Jülich, Nordrhein-Westfalen, Germany
Aram Rezikyan
Affiliation:
Corning, United States
Michael Treacy
Affiliation:
Arizona State University, United States

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Nanoscale x-ray and Electron Microscopy Techniques and Applications in Material Science
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Treacy, M.M.J., et al. , Rep. Prog. Phys., 2005. 68: p. 28992944.CrossRefGoogle Scholar
Gibson, J.M. and Treacy, M.M.J., Phys. Rev. Lett., 1997. 78: p. 10741077.CrossRefGoogle Scholar
Voyles, P.M. and Abelson, J.R., Solar Energy Materials and Solar Cells, 2003. 78: p. 85113.CrossRefGoogle Scholar
Treacy, M.M.J., et al. , J. Non-Cryst. Solids, 1998. 231: p. 99110.CrossRefGoogle Scholar
Rezikyan, A., Jibben, Z., Rock, B.A., Zhao, G., Koeck, F.A.M., Nemanich, R.F., Microscopy and Microanalysis, 2015, 21 14551474.CrossRefGoogle Scholar
Borisenko, K.B., et al. , Acta Materiala, 2012, 60, 359375.Google Scholar