Hostname: page-component-848d4c4894-5nwft Total loading time: 0 Render date: 2024-05-11T16:17:22.821Z Has data issue: false hasContentIssue false
  • English
  • Français

Recent Developments in APT Analysis Automation and Support for User-Defined Custom Analysis Procedures in IVAS 4

Published online by Cambridge University Press:  05 August 2019

A.C. Day ,
H. Francois-Saint-Cyr ,
B.P Geiser ,
T. Payne ,
E. Oltman ,
S.P. Ringer  and
D.A. Reinhard
A.C. Day*
Affiliation:
Australian Centre for Microscopy and Microanalysis, School of Aerospace, Mechanical and Mechatronics Engineering, The University of Sydney, Sydney, NSW 2006, Australia. CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
H. Francois-Saint-Cyr
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
B.P Geiser
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
T. Payne
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
E. Oltman
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
S.P. Ringer
Affiliation:
Australian Centre for Microscopy and Microanalysis, School of Aerospace, Mechanical and Mechatronics Engineering, The University of Sydney, Sydney, NSW 2006, Australia.
D.A. Reinhard
Affiliation:
CAMECA Instruments Inc., 5470 Nobel Drive, Madison, WI 53711USA.
*
*Corresponding author: alec.day@ametek.com

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Recent Developments in Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 338 - 339
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Day, A., Ceguerra, A., Ringer, S., Microsc. Microanal. in press (2019), doi:10.1017/S1431927618015593Google Scholar
[2]Wei, Y. et al. , Ultramicroscopy 194 (2018), pp. 15-24.Google Scholar
[3]Stephenson, L. et al. , Microsc. Microanal. 13 (2007), pp. 448-463.Google Scholar
[4]Wallace, N. et al. , Ultramicroscopy 189 (2018), pp. 65-75.Google Scholar
[5]Devaraj, A. et al. , International Materials Reviews 63 (2018), pp. 68-101.Google Scholar