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Recent Advances in EELS Instrumentation and Analysis: Spectroscopy and Filtered Imaging with Extended Energy, Temporal, and Dynamic Range

Published online by Cambridge University Press:  01 August 2010

RD Twesten ,
M Barfels ,
C Trevor ,
P Thomas ,
N Menon ,
A Aitouchen  and
A Gubbens
RD Twesten
Affiliation:
Gatan Inc
M Barfels
Affiliation:
Gatan Inc
C Trevor
Affiliation:
Gatan Inc
P Thomas
Affiliation:
Gatan Inc
N Menon
Affiliation:
Gatan Inc
A Aitouchen
Affiliation:
Gatan Inc
A Gubbens
Affiliation:
Gatan Inc

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 42 - 43
Copyright
Copyright © Microscopy Society of America 2010