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Real-Time 3D Analysis During Tomographic Experiments on tomviz

Published online by Cambridge University Press:  30 July 2021

Jonathan Schwartz
Affiliation:
Department of Materials Science and Engineering, University of Michigan, United States
Chris Harris
Affiliation:
Kitware, United States
Jacob Pietryga
Affiliation:
Department of Materials Science and Engineering, University of Michigan, United States
Huihuo Zheng
Affiliation:
Argonne Leadership Computing Facility, Argonne National Laboratory, United States
Prashant Kumar
Affiliation:
Department of Chemical Engineering, University of Michigan, United States
Anastasiia Visheratina
Affiliation:
Department of Chemical Engineering, University of Michigan, United States
Nicholas Kotov
Affiliation:
Department of Chemical Engineering, University of Michigan, United States
Yi Jiang
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Lemont, IL60439, USA, United States
Marcus Hanwell
Affiliation:
National Synchrotron Light Source II, Brookhaven National Laboratory, United States
Robert Hovden
Affiliation:
Department of Materials Science and Engineering, University of Michigan, United States

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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