Hostname: page-component-84b7d79bbc-g5fl4 Total loading time: 0 Render date: 2024-07-26T00:45:23.878Z Has data issue: false hasContentIssue false
  • English
  • Français

Real Time Acquisition and Calibration of S/TEM Probe Current Measurement Simultaneously with Any Imaging or Spectroscopic Signal

Published online by Cambridge University Press:  01 August 2018

Stephen D. House ,
C. Tom Schamp  and
Judith C. Yang
Stephen D. House
Affiliation:
Department of Chemical and Petroleum Engineering, University of Pittsburgh, Pittsburgh, PA (USA)
C. Tom Schamp
Affiliation:
MAS, LLC, Suwanee, GA (USA) (Previous) Hitachi High-Technologies America Inc., Dallas, TX (USA)
Judith C. Yang
Affiliation:
Department of Chemical and Petroleum Engineering, University of Pittsburgh, Pittsburgh, PA (USA)

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 126 - 127
Copyright
© Microscopy Society of America 2018 

References

References:

[1] LeBeau, JM Stemmer, S Ultramicroscopy 108 2008) pp. 1653–1658.Google Scholar
[2] Jones, L IOP Conference Series: Materials Science and Engineering 109 2016) p 012008.Google Scholar
[3] Watanabe, M Williams, DB Journal of Microscopy 221 2006) pp. 89–109.Google Scholar
[4] Chen, Z, et at, Ultramicroscopy 157 2015) pp 21–26.Google Scholar
[5] Leapman, R EELS Quantitative Analysis, in: Transmission Electron Energy Loss Spectrometry in Materials Science and The EELS Atlas (ed CC Ahn Wiley-VCH Verlag Weinheim pp. 49–96.Google Scholar
[6] Xin, HL, et al, Ultramicroscopy 139 2014) pp. 38–46.Google Scholar
[7] Mitchell, DRG Nancarrow, MJB Microscopy Research and Technique 78 2015) pp. 886–893.Google Scholar
[8] This work was supported by NSF DMREF through contract No CHE-1534630, Hitachi High-Technologies Corp., and the ETEM Catalysis Consortium (ECC, funded through U.Pitt). The authors would like to acknowledge the usage of the STEM at the Georgia Institute of Technology, as well as R.D. Twesten (Gatan) for information about the Digiscan hardware..Google Scholar