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Radiation Damage on Liquid Electrolyte during Spatially Resolved Soft X-ray Photoemission Measurements

Published online by Cambridge University Press:  05 August 2019

Christopher Arble*
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
Hongxuan Guo
Affiliation:
SEU-FEI Nano-Pico Center, Key Laboratory of MEMS of Ministry of Education, Southeast University, Nanjing 210096, P. R. China
Brian Hoskins
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
Matteo Amati
Affiliation:
Elettra Sincrotrone Trieste SCpA, SS14, Km163-5, I-34149 Trieste, Italy
Patrick Zeller
Affiliation:
Elettra Sincrotrone Trieste SCpA, SS14, Km163-5, I-34149 Trieste, Italy
Luca Gregoratti
Affiliation:
Elettra Sincrotrone Trieste SCpA, SS14, Km163-5, I-34149 Trieste, Italy
Andrei Kolmakov*
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
*Corresponding
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Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Microscopy and Microanalysis for Real-World Problem Solving
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Saveant, J, Chemical Reviews 108 (2008), p. 2348.CrossRefGoogle Scholar
[2]Larcher, D., Tarascon, J., Nature Chemistry 7 (2015), p. 19.CrossRefGoogle Scholar
[3]Kolmakov, A. et al. , Nature Nanotechnology 6 (2011) p. 651.CrossRefGoogle Scholar
[4]Velasco‐Velez, J.J. et al. , Angewandte Chemie International Edition 54 (2015). p. 14554.CrossRefGoogle Scholar
[5]Weatherup, R., Topics in Catalysis 61 (2018). p. 2085.CrossRefGoogle Scholar
[6]Yulaev, A. et al. , ACS Applied Materials and Interfaces, 9 (2017) p. 26492.CrossRefGoogle Scholar
[7]Golnak, R. et al. , Scientific Reports 6 (2016) p. 1.CrossRefGoogle Scholar
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Radiation Damage on Liquid Electrolyte during Spatially Resolved Soft X-ray Photoemission Measurements
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