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Quantitative Microanalysis at Low Voltage with a WDS Electron Microprobe Equipped with a FE Column

Published online by Cambridge University Press:  27 August 2014

Andrew N. Davis ,
Chrystel Hombourger  and
Michel Outrequin
Andrew N. Davis
Affiliation:
CAMECA Instruments, Inc., 5500 Nobel Drive Suite 100, Madison, WI 53711-4951
Chrystel Hombourger
Affiliation:
CAMECA, 29 Quai des Grésillons, 92622 Gennevilliers Cedex, France
Michel Outrequin
Affiliation:
CAMECA, 29 Quai des Grésillons, 92622 Gennevilliers Cedex, France

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 738 - 739
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Drouin, D., Réal Couture, A., Joly, D., Tastet, X., Aimez, V., Gauvin, R. Scanning, 29 (2007), 92-101.Google Scholar
[2] The authors acknowledge Ph. De Parseval et B. Abily from GET for sharing samples.Google Scholar