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Quantitative Determination of Chemical Composition of Multinary III/V Semiconductors With Sublattice Resolution Using Aberration Corrected HAADF-STEM
Published online by Cambridge University Press: 23 September 2015
Abstract
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- Abstract
- Information
- Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2081 - 2082
- Copyright
- Copyright © Microscopy Society of America 2015
References
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[5] The authors acknowledge funding from the DFG in the framework of GRK 1782 (functionalisation of semiconductors).Google Scholar