Hostname: page-component-848d4c4894-xm8r8 Total loading time: 0 Render date: 2024-06-15T19:34:44.508Z Has data issue: false hasContentIssue false

Quantitative Analysis on an Electron Probe with the NIST Transition Edge Sensor Microcalorimeter X-ray Detector

Published online by Cambridge University Press:  31 July 2006

T Jach
Affiliation:
National Institute of Standards and Technology
J Ullom
Affiliation:
National Institute of Standards and Technology
N Ritchie
Affiliation:
National Institute of Standards and Technology
J Beall
Affiliation:
National Institute of Standards and Technology

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Copyright
© 2006 Microscopy Society of America