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Quantitative Analysis on an Electron Probe with the NIST Transition Edge Sensor Microcalorimeter X-ray Detector

Published online by Cambridge University Press:  31 July 2006

T Jach ,
J Ullom ,
N Ritchie  and
J Beall
T Jach
Affiliation:
National Institute of Standards and Technology
J Ullom
Affiliation:
National Institute of Standards and Technology
N Ritchie
Affiliation:
National Institute of Standards and Technology
J Beall
Affiliation:
National Institute of Standards and Technology

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 832 - 833
Copyright
© 2006 Microscopy Society of America