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Quantifying the Advantages of Compressive Sensing and Sparse Reconstruction for Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  25 July 2016

Bryan W. Reed ,
Sang Tae Park  and
Daniel J. Masiel
Bryan W. Reed
Affiliation:
Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA, USA
Sang Tae Park
Affiliation:
Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA, USA
Daniel J. Masiel
Affiliation:
Integrated Dynamic Electron Solutions, Inc., Pleasanton, CA, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 286 - 287
Copyright
© Microscopy Society of America 2016 

References

[1] Binev, P., et al., “Compressed Sensing and Electron Microscopy. pp. 73–126 Modeling Nanoscale Imaging in Electron Microscopy. Springer (2012).CrossRefGoogle Scholar
[2] Stevens, A., et al., Microscopy 63, 41 (2014).CrossRefGoogle Scholar
[3] Béché, A., et al, arXiv 1509, 06656v1 (2015).Google Scholar
[4] Harmany, Z., Marcia, R. F. & Willett, R. M. IEEE Trans. Image Proc 21, 1084 (2012).Google Scholar
[5] This material is based upon work supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences Small Business Innovation Research program under Contract DE-SC0013104.Google Scholar