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Quantification of low-Z elements by energy-filtered scanning transmission electron microscopy

Published online by Cambridge University Press:  30 July 2021

Saleh Firoozabadi ,
Andreas Beyer ,
Pirmin Kükelhan ,
Damien Heimes ,
Jannik Lehr  and
Kerstin Volz
Saleh Firoozabadi
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Marburg, Hessen, Germany
Andreas Beyer
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Germany
Pirmin Kükelhan
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Germany
Damien Heimes
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Germany
Jannik Lehr
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, United States
Kerstin Volz
Affiliation:
Materials Science Centre and Department of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, 35032, Germany, Germany

Abstract

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Type
Diffraction Imaging Across Disciplines
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1528 - 1529
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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