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Quantification of 3D Atomic Structures and Their Dynamics by Atom-Counting from an ADF STEM Image

Published online by Cambridge University Press:  05 August 2019

Annick De Backer ,
Annelies De wael ,
Ivan Lobato ,
Thomas Altantzis ,
Armand Béché ,
Lewys Jones ,
Peter D Nellist ,
Sara Bals  and
Sandra Van Aert
Annick De Backer*
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium
Annelies De wael
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium
Ivan Lobato
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium
Thomas Altantzis
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium
Armand Béché
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium
Lewys Jones
Affiliation:
Department of Materials, University of Oxford, Oxford, United Kingdom CRANN & School of Physics, Trinity College Dublin, University of Dublin, Dublin, Ireland
Peter D Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford, United Kingdom
Sara Bals
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium
Sandra Van Aert
Affiliation:
EMAT, University of Antwerp, Antwerp, Belgium
*
*Corresponding author: annick.debacker@uantwerpen.be

Abstract

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Type
Theory and Applications of Electron Tomography in the Materials Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1808 - 1809
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Bals, S et al. , Nature Communications 3 (2012), p. 930.Google Scholar
[2]Jones, L et al. , Nano Letters 14 (2014), p. 6336.Google Scholar
[3]De Backer, A et al. , Nanoscale 9 (2017), p. 8791.Google Scholar
[4]Van Aert, S et al. , Physical Review B 87 (2013), p. 064107.Google Scholar
[5]De Backer, A et al. , Ultramicroscopy 134 (2013), p. 23.Google Scholar
[6]Altantzis, T et al. , Nano Letters 19 (2019), p. 477.Google Scholar
[7]Ghahramani, Z and Jordan, M I, Machine Learning 29 (1997), p. 245.Google Scholar
[8]This work was supported by the European Research Council (Grant 335078 COLOURATOM to SB and Grant 770887 PICOMETRICS to SVA). The authors acknowledge financial support from the Research Foundation Flanders (FWO, Belgium) through postdoctoral grants to ADB and TA, a doctoral grant to ADw, and project fundings.Google Scholar