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Probing The Mechanical Properties of Few-Layer Graphene with Aberration-Corrected, Low-Voltage STEM

Published online by Cambridge University Press:  05 August 2019

Edmund Han ,
Jaehyung Yu ,
Kayla Nguyen ,
Elif Ertekin ,
Arend van der Zande  and
Pinshane Y. Huang
Edmund Han
Affiliation:
Department of Materials Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, USA.
Jaehyung Yu
Affiliation:
Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, USA.
Kayla Nguyen
Affiliation:
Department of Materials Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, USA.
Elif Ertekin
Affiliation:
Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, USA.
Arend van der Zande
Affiliation:
Department of Mechanical Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, USA.
Pinshane Y. Huang*
Affiliation:
Department of Materials Science and Engineering, University of Illinois Urbana-Champaign, Urbana, IL, USA.
*
*Corresponding author: pyhuang@illinois.edu

Abstract

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Type
Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1730 - 1731
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Akinwande, D et al. , Extreme Mechanics Letters 13 (2017), p. 42.Google Scholar
[2]Chen, X et al. , Appl. Phys. Lett. 106 (2015), p. 101907.Google Scholar
[3]Zhang, D-B et al. , Phys. Rev. Lett. 106 (2011), p. 255503.Google Scholar
[4]Poot, M and van der Zant, HSJ, Appl. Phys. Lett. 92 (2008), p. 063111.Google Scholar
[5]Meyer, JC et al. , Phys. Rev. Lett. 108 (2013), p. 239902.Google Scholar
[6]This work was supported by the NSF-MRSEC program under NSF Award Number DMR-1720633. Experiments were carried out in the Frederick Seitz Materials Research Laboratory at the University of Illinois at Urbana-Champaign.Google Scholar