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Probing for Chemically Functional Groups on Graphene Oxide in an Aberration-Corrected Electron Microscope

Published online by Cambridge University Press:  01 August 2010

R Cieslinski ,
S Rozeveld ,
J Huang ,
P Specht  and
C Kisielowski
R Cieslinski
Affiliation:
Dow Chemical Company
S Rozeveld
Affiliation:
Dow Chemical Company
J Huang
Affiliation:
Carl Zeiss SMT Inc
P Specht
Affiliation:
University of California, Berkeley
C Kisielowski
Affiliation:
Lawrence Berkeley National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 130 - 131
Copyright
Copyright © Microscopy Society of America 2010