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Probing Disorder in MBE-grown Oxide Films Using Quantitative STEM

Published online by Cambridge University Press:  04 August 2017

Honggyu Kim ,
Santosh Raghavan ,
Omor Shoron  and
Susanne Stemmer
Honggyu Kim
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA
Santosh Raghavan
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA
Omor Shoron
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA
Susanne Stemmer
Affiliation:
Materials Department, University of California, Santa Barbara, CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1578 - 1579
Copyright
© Microscopy Society of America 2017 

References

[1] Raghavan, S., et al, APL Materials 4 2016 016106.CrossRefGoogle Scholar
[2] LeBeau, J. M., et al, Phys. Rev. Lett 100 2008 206101.CrossRefGoogle Scholar
[3] Zhang, J. Y., et al, Sci. Rep 5 2015 12419.CrossRefGoogle Scholar
[4] The authors acknowledge support by the U.S. Department of Energy (Grant No. DEFG02-2ER45994).Google Scholar