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Preparation of Transmission Electron Microscope Specimens from Ultra-Fine Fibers by a FIB Technique

Published online by Cambridge University Press:  24 July 2003

Jian Li ,
V. Y. Gertsman  and
J. Lo
Jian Li
Affiliation:
Materials Technology Laboratory, CANMET, 568 Booth St. Ottawa, Ontario, Canada, K1A 0G1
V. Y. Gertsman
Affiliation:
Materials Technology Laboratory, CANMET, 568 Booth St. Ottawa, Ontario, Canada, K1A 0G1
J. Lo
Affiliation:
Materials Technology Laboratory, CANMET, 568 Booth St. Ottawa, Ontario, Canada, K1A 0G1

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 888 - 889
Copyright
Copyright © Microscopy Society of America 2003