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Precise Measurements of Transmission Attenuation in Mass-Thickness Contrast TEM Images

Published online by Cambridge University Press:  05 August 2019

Jun Yamasaki ,
Yuya Ubata  and
Hidehiro Yasuda
Jun Yamasaki*
Affiliation:
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Ibaraki, Japan. Institute of Materials and Systems for Sustainability, Nagoya University, Nagoya, Japan.
Yuya Ubata
Affiliation:
Department of Electronic Engineering, Osaka University, Suita, Japan.
Hidehiro Yasuda
Affiliation:
Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Ibaraki, Japan. Division of Materials and Manufacturing Science, Osaka University, Suita, Japan.
*
*Corresponding author: yamasaki@uhvem.osaka-u.ac.jp

Abstract

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Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2418 - 2419
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Yamasaki, J et al. , Microscopy 63 (2014), p. 345.Google Scholar
[2]Yamasaki, J, Ubata, Y and Yasuda, H, Ultramicroscopy (2019), in press.Google Scholar
[3]Crowther, J A, Proc. Roy. Soc. A 84 (1910), p. 226.Google Scholar
[4]The authors are grateful to Prof. H. Mori for invaluable discussion and Mr. E. Taguchi, Mr. T. Sakata and Mr. T. Yasuda of Osaka university, and Mr. A. Ohsaki, Dr. S. Ohta, and Mr. S. Takakuwa of JEOL Co., Ltd., and Dr. S. Arai of Nagoya university for their assistance with the experiments. This work was partly supported by MEXT KAKENHI (grant number 26105009).Google Scholar