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A Practically Simple and Easy Approach for Minimizing the Influence of Fresnel Fringes on Phase Sensitivity Measured from Electron Holography

Published online by Cambridge University Press:  23 September 2015

Zhouguang Wang
Zhouguang Wang*
Affiliation:
Micron Technology Inc., Boise, Idaho, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1953 - 1954
Copyright
Copyright © Microscopy Society of America 2015 

References

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[3] Yamamoto, K., Kawajiri, I., Tanji, T., Hibino, M. & Hirayama, T., J. Electr. Microsc 49 (2000) p31.CrossRefGoogle Scholar