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The Potential Benefits of Compressed Sensing and Machine Learning for Advanced Imaging and Spectroscopy in the Electron Microscope

Published online by Cambridge University Press:  30 July 2020

Nigel Browning ,
Robert Klie ,
Anthony Barker ,
Andrew Stevens  and
Christopher Buurma
Nigel Browning
Affiliation:
Sivananthan Laboratories, Inc., Bolingbrook, Illinois, United States
Robert Klie
Affiliation:
University of Illinois at Chicago, Chicago, Illinois, United States
Anthony Barker
Affiliation:
Sivananthan Laboratories, Inc., Bolingbrook, Illinois, United States
Andrew Stevens
Affiliation:
Sivananthan Laboratories, Inc., Bolingbrook, Illinois, United States
Christopher Buurma
Affiliation:
Sivananthan Laboratories, Inc., Bolingbrook, Illinois, United States

Abstract

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Type
Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 2458 - 2460
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Copyright
Copyright © Microscopy Society of America 2020

References

Stevens, A., Yang, H., Carin, L., Arslan, I., and Browning, N. D. (2014) The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images. Microscopy 63, (1) 41-51.10.1093/jmicro/dft042CrossRefGoogle ScholarPubMed
Stevens, A., Kovarik, L., Abellan, P., Yuan, X., Carin, L., and Browning, N. D. (2015) Applying compressive sensing to TEM video: A substantial frame rate increase on any camera. Advanced Structural and Chemical Imaging 1, (1) 1-20.10.1186/s40679-015-0009-3CrossRefGoogle Scholar
Kovarik, L., Stevens, A., Liyu, A., Browning, N. D (2016) Implementing an Accurate and Rapid Sparse Sampling Approach for Low-Dose Atomic Resolution STEM Imaging of Electron Beam Sensitive Materials”, APL 109, 164102Google Scholar
Stevens, A., Yang, H., Luzzi, L., Kovarik, L., Mehdi, B. L., Liyu, A., Gehm, M. E., Browning, N. D. (2017) Sub-sampled Approaches for Extremely Low-Dose STEM, APL 112, 043104 (2018)Google Scholar
Stevens, A., Yang, H., Hao, W., Jones, L., Ophus, C., Nellist, P. D., Browning, N. D. (2018) Sub-sampled STEM-Ptychography, APL 113, 033104Google Scholar
Mehdi, B. L., Stevens, A., Kovarik, L., Jiang, N., Mehta, H., Liyu, A., Reehl, S., Stanfill, B., Luzzi, L., MacPhee, K., Bramer, L., Browning, N. D. (2019) Controlling and Observing the Kinetics of Nucleation and Growth by Sub-Sampling Dynamic In-Situ STEM Images, APL 115, 063102Google Scholar