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The Position-Sensitive Atom Probe - A New Dimension In Atom Probe Analysis

Published online by Cambridge University Press:  02 July 2020

A. Cerezo ,
P.J. Warren  and
G.D.W. Smith
A. Cerezo
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK.
P.J. Warren
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK.
G.D.W. Smith
Affiliation:
Department of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, UK.
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Extract

A possible description of the ideal microscope would be an instrument which was able to reconstruct, with atomic resolution and in 3 dimensions, both the position and the chemical identity of atoms in a material. The 3-dimensional atom probe (3DAP) is the technique which comes closest to this goal.

The position-sensitive atom probe (PoSAP) was the first 3DAP. In the PoSAP, the high magnification of the field-ion microscope is combined with the time-of-flight mass spectroscopy of the atom probe, and position-sensitive detection based on a wedge-and-strip anode, Fig.1. This combination allows the chemical identity and the original surface position to be determined for single atoms removed from a field-ion specimen by pulsed field evaporation. Continued field evaporation and analysis builds up a 3D image of the distribution of all the atomic species originally present in the material, Fig. 2.

Type
Imaging and Analysis at the Atomic Level: 30 Years of Atom Probe Field Ion Microscopy
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 76 - 77
Copyright
Copyright © Microscopy Society of America

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References

1.Cerezo, A. et al., Rev. Sci. Instrum. 59 (1988) 862.CrossRefGoogle Scholar
2.Blavette, D. et al., Rev. Sci. Instrum. 64 (1993) 2911.CrossRefGoogle Scholar
3.Cerezo, A. et al., Appl. Surf. Sci. 76/77 (1994) 374.CrossRefGoogle Scholar
4.Cerezo, A. et al., Rev. Sci. Instrum. 69 (1998) 49.CrossRefGoogle Scholar
5.Camus, P.P. et al., Appl. Surf. Sci. 87/88 (1995) 305.CrossRefGoogle Scholar