Hostname: page-component-76fb5796d-r6qrq Total loading time: 0 Render date: 2024-04-25T16:24:05.316Z Has data issue: false hasContentIssue false

Phase Transformations in an Austenitic Stainless Steel Weld During Postweld Heat Treatment

Published online by Cambridge University Press:  02 July 2020

M. G. Burke
Affiliation:
Bechtel Bettis, Inc., West Mifflin, PA, 15122-0079
N. T. Nuhfer
Affiliation:
Department of Materials Science and Engineering, Carnegie-Mellon University, Pittsburgh, PA, 15213
Get access

Abstract

The microstructural development in a Type 309 stainless steel weldment associated with a post-weld heat treatment of 30 h at 580°C has been studied using analytical electron microscopy (AEM). The purpose of post-weld thermal treatments is generally to relieve stresses within the weld, thereby improving performance. Microstructural stability during these thermal treatments is important for the weld; i.e., no deleterious phases should form. in this example, detailed microstructural analyses of a weldment in the as-welded and postweld heat-treated condition have been performed. Microstructural analyses were performed using Philips CM 12 and CM300-FEG analytical electron microscopes equipped with Oxford Instruments ISIS analyzers and LZ5 energy dispersive x-ray spectrometers, and a CM200-FEG analytical electron microscope equipped with a Gatan Image Filter (GIF).

As-Welded Condition:The microstructure of the weld was characterized by the presence of dislocated austenite (γ) and a network of delta (δ) ferrite.

Type
Microscopy in the Real World: Alloys and Other Materials
Copyright
Copyright © Microscopy Society of America 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Vitek, J. and David, S.A., Welding Journal, 63 (1984) 246s.Google Scholar
2.Bentley, J., Microscopy and Microanalysis, 6 (2000) 362.CrossRefGoogle Scholar
3.Miller, M. K. and J. Bentley, Mat. Sci. & Tech., 6 (1990) 249.Google Scholar