Hostname: page-component-848d4c4894-pjpqr Total loading time: 0 Render date: 2024-06-22T16:25:01.774Z Has data issue: false hasContentIssue false
  • English
  • Français

Performance of Low-kV Aberration-corrected STEM with Delta-corrector and CFEG in Ultrahigh Vacuum Environment

Published online by Cambridge University Press:  04 August 2017

Takeo Sasaki ,
Shigeyuki Morishita ,
Yuji Kohno ,
Masaki Mukai ,
Koji Kimoto  and
Kazu Suenaga
Takeo Sasaki
Affiliation:
EM Business unit, JEOL Ltd., Tokyo 196-8558, Japan
Shigeyuki Morishita
Affiliation:
EM Business unit, JEOL Ltd., Tokyo 196-8558, Japan
Yuji Kohno
Affiliation:
EM Business unit, JEOL Ltd., Tokyo 196-8558, Japan
Masaki Mukai
Affiliation:
EM Business unit, JEOL Ltd., Tokyo 196-8558, Japan
Koji Kimoto
Affiliation:
Research Center for Advanced Measurement and Characterization , National Institute for Materials Science (NIMS), Ibaraki 305-0044, Japan
Kazu Suenaga
Affiliation:
■

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 468 - 469
Copyright
© Microscopy Society of America 2017 

References

[1] Sasaki, T., et al, J. Electron Microscopy 59 2010). p. S7.CrossRefGoogle Scholar
[2] Morishita, S., et al, Phys. Rev. Lett. 117 2016). p. 153004.CrossRefGoogle Scholar