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Performance Analysis of Interaction-Free-Measurement-based Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

Akshay Agarwal ,
Vivek Goyal  and
Karl K. Berggren
Akshay Agarwal*
Affiliation:
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA
Vivek Goyal
Affiliation:
Department of Electrical and Computer Engineering, Boston University, Boston, Massachusetts, USA
Karl K. Berggren
Affiliation:
Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, Massachusetts, USA
*
*Corresponding author: akshayag@mit.edu

Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 152 - 153
Copyright
Copyright © Microscopy Society of America 2019 

References

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[5]Agarwal, A. et al. , Sci. Rep. 7 (2017), 1677.Google Scholar
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[8]Agarwal, A., Berggren, K. and Goyal, V., arXiv:1901:09702 [physics.ins-det] (2019)Google Scholar
[9]The authors acknowledge funding from the Gordon and Betty Moore Foundation, and the U.S. NSF under grands 1422034 and 1815896, and useful discussions with the QEM-2 collaboration.Google Scholar