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The Optimization of a 4-Element Input Lens on a Hemispherical Deflector Analyzer Using SIMION

Published online by Cambridge University Press:  28 September 2015

TJM Zouros
Affiliation:
Dept. of Physics, Univ. of Crete, P.O Box 2208, GR 71003 Heraklion, Greece. Tandem Accelerator Laboratory, INPP, NCSR Demokritos, GR 15310 Ag Paraskevi, Greece.
A. Kanellakopoulos
Affiliation:
Dept. of Physics, Univ. of Athens, Zografou Campus, GR 15784 Athens, Greece.
I. Madesis
Affiliation:
Dept. of Physics, Univ. of Crete, P.O Box 2208, GR 71003 Heraklion, Greece. Tandem Accelerator Laboratory, INPP, NCSR Demokritos, GR 15310 Ag Paraskevi, Greece.
A. Dimitriou
Affiliation:
Dept. of Physics, Univ. of Crete, P.O Box 2208, GR 71003 Heraklion, Greece. Tandem Accelerator Laboratory, INPP, NCSR Demokritos, GR 15310 Ag Paraskevi, Greece.
M. Fernández-Martín
Affiliation:
Dept. de Física Aplicada III, Fac. de Física, UCM 28040-Madrid, Spain.
G. Martinez
Affiliation:
Dept. de Física Aplicada III, Fac. de Física, UCM 28040-Madrid, Spain.
T.J. Mertzimekis
Affiliation:
Dept. of Physics, Univ. of Athens, Zografou Campus, GR 15784 Athens, Greece.

Abstract

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Type
Energy Spectrometers
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

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[10] We acknowledge partial support by the European Union (European Social Fund - ESF) and Greek national funds through the Operational Program “Education and Lifelong Learning“ of the National Strategic Reference Framework (NSRF) Research Funding Program: THALES, Investing in knowledge society through the European Social Fund (Grant No. MIS 377289). This work was also supported by the Spanish Ministerio de Economía y Competitividad under project FIS2012-31230..Google Scholar