Hostname: page-component-848d4c4894-4rdrl Total loading time: 0 Render date: 2024-07-03T14:26:39.170Z Has data issue: false hasContentIssue false
  • English
  • Français

On the Contrast and Resolution of Secondary and Backscattered Electron Images in a FE-SEM

Published online by Cambridge University Press:  31 July 2003

Raynald Gauvin1 ,
Paula Horny  and
Eric Lifshin
Raynald Gauvin1
Affiliation:
Department Metals and Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 2B2
Paula Horny
Affiliation:
Department Metals and Materials Engineering, McGill University, Montréal, Québec, Canada, H3A 2B2
Eric Lifshin
Affiliation:
Albany Institute for Materials, CESTM, 251 Fuller Road, Albany, NY, 12301, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 970 - 971
Copyright
Copyright © Microscopy Society of America 2003