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Olis: On-Line Image Simulation And Structure Characterization For The Materials Microcharacterization Collaboratory

Published online by Cambridge University Press:  02 July 2020

Michael A. O'Keefe
Affiliation:
NCEM, University of California, LBNL B7, Berkeley, CA94720
John R. Taylor
Affiliation:
ICSD, University of California, LBNL B50B, Berkeley, CA94720
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Extract

The Materials Microcharacterization Collaboratory (MMC), a pilot project of the DOE2000 program, links DOE-sponsored electron microscope user facilities at ANL, LBNL, ORNL and UIUC with that at NIST to form one collaboratory. The MMC brings the microcharacterization and microanalysis tools available in these national centers to geographically-dispersed researchers working in industries,universities, and government laboratories. It enables remote users to share on-line the instrumentation, knowledge and expertise available at the individual facilities making up the collaboratory.

On-line services available to users of the MMC may be classified as instrument, computational, and exchange services (fig. 1). LBNL's contribution to the MMC's instrumentation includes a Kratos EM-1500 HVEM (for remote in-situ high-voltage microscopy) and a Philips CM300 HREM (remote highresolution capability). DeepView is an exchange service that provides a common graphical userinterface (GUI) for control of MMC instruments over the wide area network (both the client and server sides of DeepView are available for download).

Type
Shared Resources And User Facilities: Access To Instrumentation
Copyright
Copyright © Microscopy Society of America

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References

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10. Work supported by Director, Office of Energy Research — through the Office of Basic Energy Sciences, Material Sciences Division, and through the Office of Computational and Technology Research, Mathematical Information and Computational Sciences — of the U.S. Department of Energy, under contract No. DE-AC03-76SF00098.Google Scholar