Hostname: page-component-848d4c4894-8bljj Total loading time: 0 Render date: 2024-06-25T18:13:26.511Z Has data issue: false hasContentIssue false
  • English
  • Français

Observation of Point Defect in Silicon using HRTEM

Published online by Cambridge University Press:  01 August 2004

Sung Il Baik ,
Hee-Suk Chung ,
Jian-Min Zuo  and
Young-Woon Kim
Sung Il Baik
Affiliation:
Seoul National University
Hee-Suk Chung
Affiliation:
Seoul National University
Jian-Min Zuo
Affiliation:
University of Illinois
Young-Woon Kim
Affiliation:
Seoul National University
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 994 - 995
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)