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Novel Approaches in Spectrum-Image Analysis

Published online by Cambridge University Press:  02 July 2020

P.J. Thomas*
Affiliation:
Gatan R&D, Ferrymills 3, Osney Mead, Oxford, OX2 OES, UK
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Abstract

It is now becoming increasingly more commonplace to acquire three-dimensional EELS data sets, whether by parallel acquisition of a linear series of spectra to form an EELS spectrum-image, or by discretely sampling energy-loss space through a series of energy-filtered images to build an EFTEM image-spectrum. These data sets can contain large amounts of both spectral and spatial information, and, as a result, the distinction between the two acquisition modes is becoming increasingly blurred. Accordingly, approaches are required that facilitate both the techniques developed for EFTEM and EELS analyses, in order to obtain optimal information from the acquired data.

An example of such an approach is illustrated by means of characterisation of a Mn and Fe rich intermetallic particle in a cast aluminium alloy (Figs. a-f). A continuous EFTEM image-series was acquired from 0-800 eV loss, using a CM300 FEGTEM equipped with a 2k Gatan Imaging Filter.

Type
EELS Microanalysis At High Sensitivity: Advances in Spectrum Imaging, Energy Filtering and Detection (Organized by R. Leapman and J. Bruley)
Copyright
Copyright © Microscopy Society of America 2001

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References

references

1.)Jeanguillaume, C. and Colliex, C., Ultramicroscopy 28 (1989) 252CrossRefGoogle Scholar
2.)Thomas, P.J. and Midgley, P.A., submitted to Ultramicroscopy.Google Scholar
3.)Grogger, W.et al., Micron 29 (1998) 4351CrossRefGoogle Scholar
4.)Alexander, Duncanand Alcan International Limited (Banbury Laboratory) are gratefully acknowledged for provision of the sample used in this study.Google Scholar
5.) Data used in this study was collected whilst the author was conducting post-doctorate research at the Dept. of Materials Sci. and Metallurgy, University of Cambridge. Their contribution is gratefully acknowledged.Google Scholar