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Non-uniform Distribution of Doped Carrier in a Na-doped CaB6 Bulk Material Observed by EPMA-SXES

Published online by Cambridge University Press:  01 August 2018

Masami Terauchi
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan
Yohei Sato
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan
Masatoshi Takeda
Affiliation:
Materials Design and Engineering Group, Nagaoka University of Technology, Nagaoka, Japan
Tadashi Hatano
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, Japan
Masato Koike
Affiliation:
QuBS Directorate, National Institute for Quantum and Radiological Science, Kizugawa, Japan
Hiroyuki Sasai
Affiliation:
Device Department, SHIMADZU Corp., Kyoto, Japan
Tetsuya Nagano
Affiliation:
Device Department, SHIMADZU Corp., Kyoto, Japan
Masaru Koeda
Affiliation:
Device Department, SHIMADZU Corp., Kyoto, Japan
Takanori Murano
Affiliation:
SA Business Unit, JEOL Ltd., Akishima, Japan
Hideyuki Takahashi
Affiliation:
SA Business Unit, JEOL Ltd., Akishima, Japan

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Takahashi, H, et al, Microscopy and Microanalysis 20(Suppl 3 2014) p. 684.Google Scholar
[2] Takahashi, H, et al, Abstract of EMAS 2017/IUMAS-7 2017) p. 458.Google Scholar
[3] Terauchi, M inValence electron spectroscopy for transmission electron microscopy", ed. by CSSR Kumar (Springer-Verlag, Berlin Heidelberg, 2014) p. 287.Google Scholar
[4] Takeda, M, et al, J. Solid State Chemistry 179 2006) p. 2823.Google Scholar
[5] Kuribayashi, H, Makino, S Takeda, M Abstract of ISBB-18 2014) p. 148.Google Scholar
[6] This work was partly supported by the Research Program of "Dynamic Alliance for Open Innovation Bridging Human, Environment and Materials" in "Network Joint Research Centre for Materials and Devices".Google Scholar