Hostname: page-component-76fb5796d-vvkck Total loading time: 0 Render date: 2024-04-27T20:12:27.971Z Has data issue: false hasContentIssue false

A Next Generation Electron Microscopy Detector Aimed at Enabling New Scanning Diffraction Techniques and Online Data Reconstruction

Published online by Cambridge University Press:  01 August 2018

Ian J. Johnson
Affiliation:
Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California, USA
Karen C. Bustillo
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley NationalLaboratory, Berkeley, California, USA
Jim Ciston
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley NationalLaboratory, Berkeley, California, USA
Brent R. Draney
Affiliation:
National Energy Research Scientific Computing Center, Berkeley, California, USA
Peter Ercius
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley NationalLaboratory, Berkeley, California, USA
Erin Fong
Affiliation:
Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California, USA
Azriel Goldschmidt
Affiliation:
Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California, USA
John M. Joseph
Affiliation:
Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California, USA
Jason R. Lee
Affiliation:
National Energy Research Scientific Computing Center, Berkeley, California, USA
Andrew M. Minor
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley NationalLaboratory, Berkeley, California, USA
Colin Ophus
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley NationalLaboratory, Berkeley, California, USA
Ashwin Selvarajan
Affiliation:
National Energy Research Scientific Computing Center, Berkeley, California, USA
David E. Skinner
Affiliation:
National Energy Research Scientific Computing Center, Berkeley, California, USA
Thorsten Stezelberger
Affiliation:
Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California, USA
Craig S. Tindall
Affiliation:
Engineering Division, Lawrence Berkeley National Laboratory, Berkeley, California, USA
Peter Denes
Affiliation:
Physical Sciences, Lawrence Berkeley National Laboratory, Berkeley, California, USA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[2] Kisielowski, C., et al, Microscopy and Microanalysis 14(no. 5 2008) p. 469.Google Scholar
[3] Battaglia, M., et al, Nucl. Inst. and Methods in Phys. Res. A 622(no. 3 2010) p. 669.Google Scholar
[4] Ophus, C., et al, Nat. Comm 7 2016) p. 10719.Google Scholar
[5] Jiang, Y, et al arXiv:1801.04630 2018.Google Scholar
[6] This work was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. Research was performed at the Molecular Foundry and the National Energy Research Scientific Computing Center, DOE Office of Science User Facilities.Google Scholar