New tools for Micro-Characterization at low Beam voltages (The right tools for the right Job)

Del Redfern; Joe Nicolosi

doi:10.1017/S1431927602106209

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New tools for Micro-Characterization at low Beam voltages (The right tools for the right Job)

Published online by Cambridge University Press: 01 August 2002

Del Redfern and

Joe Nicolosi

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Del Redfern: Affiliation:
EDAX Inc. Mahwah, NJ, USA
Joe Nicolosi: Affiliation:
EDAX Inc. Mahwah, NJ, USA

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 714 - 715

DOI: https://doi.org/10.1017/S1431927602106209 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2002

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New tools for Micro-Characterization at low Beam voltages (The right tools for the right Job)

Volume 8, Issue S02
Del Redfern ^(a1) and Joe Nicolosi ^(a1)
DOI: https://doi.org/10.1017/S1431927602106209

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New tools for Micro-Characterization at low Beam voltages (The right tools for the right Job)

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