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New Slow-Scan CCD Cameras (SSC) with Frame/Interline CCD Architecture Avoid TEM Shutter Control, Provide Excellent Image Quality and can be Easily Retrofitted

Published online by Cambridge University Press:  02 July 2020

S.A. Hiller ,
W. Probst ,
V. Seybold  and
E. Zellmann
S.A. Hiller
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl-Zeiss-Str. 56, D-73446 Oberkochen/ Germany
W. Probst
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl-Zeiss-Str. 56, D-73446 Oberkochen/ Germany
V. Seybold
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl-Zeiss-Str. 56, D-73446 Oberkochen/ Germany
E. Zellmann
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl-Zeiss-Str. 56, D-73446 Oberkochen/ Germany
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Extract

Since it's introduction into TEM in 1986 [1] SSCs have become an effective and easy-to-use solution for acquiring high quality digital images electronically. Their main advantages are excellent linearity, very high dynamic, high sensitivity, and low noise. These advantages have made SSCs a nondispensable tool for quantitative image analysis. Moreover, since SSCs make high quality TEM images available in a computer within fraction of seconds, on-line image processing and software driven automated TEM tuning has become possible [2]. Many of the experiments which are performed nowadays in the area of high resolution, low dose, holographic reconstruction, and EFTEM [3] would not be possible without the digital input coming from SSCs.

Like recording images with a film sheet camera, digital recording of images with SSC requires control of the TEM beam blanker (shutter) by the SSC synchronised with the image acquisition process.

This blanker (shutter) control is a critical link in the chain to the digital image. Many older TEMs do not have direct access to beam blanking coils, or contrary to modern TEMs their coils are not designed to support hysteresis-free fast beam blanking, what is essential for acquisition of high quality digital images by a SSC.

Type
Advances in Instrumentation
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 350 - 351
Copyright
Copyright © Microscopy Society of America

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References

[1]Mochel, M.E. and Mochel, J.M., in: Proc. 44th Annual EMSA Meeting, Ed. Bailey, G. W. (San Francisco Press, San Francisco, 1986), p. 616.Google Scholar
[2]Krivanek, O.L. and Mooney, P.E., Applications of slow-scan CCD cameras in transmission electron microscopy, Ultra microscopy 49 (1993), 95–108.CrossRefGoogle Scholar
[3]Jäger, W. and Mayer, J., Energy-filtered transmission electron microscopy of SimGen superlattices and SimGen heterostructures. I. Experimental results, Ultramicroscopy 59 (1995), 33–45.CrossRefGoogle Scholar