Hostname: page-component-848d4c4894-v5vhk Total loading time: 0 Render date: 2024-06-25T06:10:03.881Z Has data issue: false hasContentIssue false
  • English
  • Français

A New Laboratory Designed to Provide an Optimum Environment for Aberration-Corrected Electron Microscopes

Published online by Cambridge University Press:  01 August 2002

L. F. Allard ,
D. A. Blom ,
T. A. Nolan ,
W. H. Sides ,
L. J. Degenhardt ,
J. A. Mayo ,
W. Vogen  and
E. St. Romain
L. F. Allard
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6064
D. A. Blom
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6064
T. A. Nolan
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6064
W. H. Sides
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6064
L. J. Degenhardt
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6064
J. A. Mayo
Affiliation:
Oak Ridge National Laboratory, PO Box 2008, Oak Ridge, TN 37831-6064
W. Vogen
Affiliation:
Vibration Engineering Associates, 4555 Paul Sweet Road, Santa Cruz, CA 95065
E. St. Romain
Affiliation:
Lord, Aeck & Sargent, 1201 Peachtree Street, NE Ste 300, Atlanta, GA 30361-3500

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 478 - 479
Copyright
Copyright © Microscopy Society of America 2002