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New Frame-Transfer Wide-Angle Slow-Scan CCD Camera Allows Recording of Distortion-Free Images for Digital Montages

Published online by Cambridge University Press:  02 July 2020

S.A. Hiller ,
W. Probst ,
V. Seybold ,
E. Zellmann ,
B. Kabius  and
A. Trondle
S.A. Hiller
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl-Zeiss-Str. 56, D-73447, Oberkochen/ , Germany
W. Probst
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl-Zeiss-Str. 56, D-73447, Oberkochen/ , Germany
V. Seybold
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl-Zeiss-Str. 56, D-73447, Oberkochen/ , Germany
E. Zellmann
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl-Zeiss-Str. 56, D-73447, Oberkochen/ , Germany
B. Kabius
Affiliation:
LEO Elektronenmikroskopie GmbH, Carl-Zeiss-Str. 56, D-73447, Oberkochen/ , Germany
A. Trondle
Affiliation:
PROSCAN elektronische Systeme GmbH, Lechstr. 40, D-86937, Scheuring/ , Germany
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Extract

Modern SSCs combine low noise with high sensitivity and provide digital images with high dynamic and excellent linearity. Since these images are immediately available in a PC, SSCs have become a non-dispensable tool for on-line image processing and software driven automated TEM tuning [1]. Many experiments performed nowadays in the area of high resolution, low dose, holographic reconstruction, and EFTEM [2] would not be possible without the digital input coming from SSCs.

Despite their excellent characteristics SSCs provide a restricted number of individual image points in respect to film. This turned out to be the most prominent disadvantage of SSCs especially for applications where highly resolved large specimen areas need to be captured. Tab. 1 shows a typical example for a biological application where an image detail of 4 nm (plasma membrane) needs to be resolved. Depending on the film material used, this resolution is matched more or less by a TEM magnification of ∼8,000x.

Type
Advances in Digital Imaging
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 1020 - 1021
Copyright
Copyright © Microscopy Society of America

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References

References:

[1]Krivanek, O.L. and Mooney, P.E., Applications of slow-scan CCD cameras in transmission electron microscopy, Ultramicroscopy 49 (1993), 95–108.CrossRefGoogle Scholar
[2]Jager, W. and Mayer, J., Energy-filtered transmission electron microscopy of SimGen superlattices and Si-Ge heterostructures. I. Experimental results, Ultramicroscopy 59 (1995), 33–45.CrossRefGoogle Scholar
[3]Hiller, S.A., et al., New SSC Cameras with frame/interline CCD architecture avoid TEM shutter control, provide excellent image quality and can be easily retrofitted, Proc. MSA (1999).CrossRefGoogle Scholar