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A New Design for Measuring Potentials in Operando Nanoelectronic Devices by Electron Holography

Published online by Cambridge University Press:  27 August 2014

Kai He  and
John Cumings
Kai He
Affiliation:
Department of Materials Science and Engineering, University of Maryland, College Park, MD 20742 Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY 11973
John Cumings
Affiliation:
Department of Materials Science and Engineering, University of Maryland, College Park, MD 20742

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 266 - 267
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] McCartney, M Rand Smith, D J Annu. Rev. Mater. Res. 37 2007) 729.Google Scholar
[2] McCartney, M R, et al Ultramicroscopy 110 2001) 375.Google Scholar
[3] He, K and Cumings, J Nano Lett. 13 2013) 4815.Google Scholar
[4] The authors acknowledge funding support from U.S. Department of Energy under Award Number DE-FG02-10ER46742 and Award Number DESC0001160, as well as use of facilities in Maryland NanoCenter and its NispLab supported in part by NSF MRSEC Grant DMR 05-20471.Google Scholar