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New Approaches for high lateral resolution Array Tomography analysis

Published online by Cambridge University Press:  04 August 2017

Yuuki Yamaguchi
Affiliation:
JEOL Ltd. Electron Optics Division 1-2 Musashino 3-Chome Akishima TOKYO 196-8558 JAPAN Multi-Modal Microstructure Analysis Unit, RIKEN CLST-JEOL Collaboration Center, Kobe, Japan
Mitsuyo Maeda
Affiliation:
Multi-Modal Microstructure Analysis Unit, RIKEN CLST-JEOL Collaboration Center, Kobe, Japan
Yosky Kataoka
Affiliation:
Multi-Modal Microstructure Analysis Unit, RIKEN CLST-JEOL Collaboration Center, Kobe, Japan
Yukari Moriya
Affiliation:
JEOL Ltd. Electron Optics Division 1-2 Musashino 3-Chome Akishima TOKYO 196-8558 JAPAN
Chikako Nakayama
Affiliation:
JEOL Ltd. Electron Optics Division 1-2 Musashino 3-Chome Akishima TOKYO 196-8558 JAPAN
Tomohiro Haruta
Affiliation:
JEOL Ltd. Electron Optics Division 1-2 Musashino 3-Chome Akishima TOKYO 196-8558 JAPAN
Mitsuo Suga
Affiliation:
JEOL Ltd. Electron Optics Division 1-2 Musashino 3-Chome Akishima TOKYO 196-8558 JAPAN Multi-Modal Microstructure Analysis Unit, RIKEN CLST-JEOL Collaboration Center, Kobe, Japan
Natasha Erdman
Affiliation:
JEOL USA, INC. 11 Dearborn Road Peabody, MA 01960USA
Shunsuke Asahina
Affiliation:
JEOL Ltd. Electron Optics Division 1-2 Musashino 3-Chome Akishima TOKYO 196-8558 JAPAN

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] Micheva, K.D & Smith, S.J Neuron 55(1 2007). p 25.Google Scholar
[2] Horstmann, H, et al, PLoS One 7(4 2012 e35172.Google Scholar
[3] Suga, M, et al, Progress in Solid State Chemistry 42 2014). P 1.Google Scholar