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Multivariate Statistical Analysis of Spectrum Lines From Si3N4 Grain Boundaries

Published online by Cambridge University Press:  02 July 2020

P. M. Rice ,
K. B. Alexander  and
I. M. Anderson
P. M. Rice
Affiliation:
Metals & Ceramics Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN, 37831
K. B. Alexander
Affiliation:
Metals & Ceramics Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN, 37831
I. M. Anderson
Affiliation:
Metals & Ceramics Division, Oak Ridge National Laboratory, P.O. Box 2008, Oak Ridge, TN, 37831
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Extract

It is well known that the high-temperature properties of polycrystalline Si3N4 ceramics are strongly influenced by the nanometer-scale glassy phase at the grain boundaries. We have recently analyzed the variation of the near-edge fine structure (ELNES) of the Si-L2,3 edges using a combination of TEM spectrum-line acquisition with an imaging filter and multivariate statistical analysis.

The glassy phase at the Si3N4 grain boundaries is easily damaged by the the fine probes usually used in scanning transmission electron microscopy to acquire ELNES data. Thus an alternative method using a Gatan imaging filter (GIF), called TEM spectrum-line analysis, was used. In this mode, energy-loss spectra are dispersed along one axis of the CCD detector, while the orthogonal axis displays the spatial variation across the interface. In this mode, a slotted washer is used as the GIF entrance aperture, with its minor axis parallel to the energy-dispersion direction of the spectrometer.

Type
Quantitative Analysis For Series of Spectra and Images: Getting The Most From Your Experimental Data
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 945 - 946
Copyright
Copyright © Microscopy Society of America 1997

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References

1. Bentley, J. and Anderson, I.M., Microscopy & Microanalysis 1996, 532.CrossRefGoogle Scholar

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3. Anderson, I.M. and Bentley, J., Mater. Res. Soc. Proc, 458(1997) in press.CrossRefGoogle Scholar

4. Research at the Oak Ridge National Laboratory (ORNL) SHaRE User Facility was sponsored by the Division of Materials Sciences, U.S. Department of Energy, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research Corp., and by an appointment (IMA) to the ORNL Postdoctoral Research Associates Program, which is administered jointly by the Oak Ridge Institute for Science and Education and ORNL.Google Scholar