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Multislice Electron Scattering Simulations for Angstrom-scale Magnetic Measurements with 4D-STEM

Published online by Cambridge University Press:  30 July 2020

Kayla Nguyen
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Jeffrey Huang
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Manohar Karigerasi
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Kisung Kang
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Andre Schleife
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Daniel Shoemaker
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
David Cahill
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Jian-Min Zuo
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States
Pinshane Huang
Affiliation:
University of Illinois at Urbana-Champaign, Urbana, Illinois, United States

Abstract

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Type
Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): New Experiments and Data Analyses for Determining Materials Functionality and Biological Structures
Copyright
Copyright © Microscopy Society of America 2020

References

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This work was supported by the NSF-MRSEC program under NSF Award Number DMR-1720633. Experiments were carried out in the Frederick Seitz Materials Research Laboratory at the University of Illinois at Urbana-Champaign.Google Scholar
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