Hostname: page-component-5c6d5d7d68-qks25 Total loading time: 0 Render date: 2024-08-18T16:27:51.647Z Has data issue: false hasContentIssue false
  • English
  • Français

Multiple Double XTEM Sample Preparation of Sub-10 nm Diameter Si Nanowires

Published online by Cambridge University Press:  01 August 2010

L Gignac ,
S Mittal ,
S Bansaruntip ,
G Cohen  and
J Sleight
L Gignac
Affiliation:
IBM Research
S Mittal
Affiliation:
IBM Research
S Bansaruntip
Affiliation:
IBM Research
G Cohen
Affiliation:
IBM Research
J Sleight
Affiliation:
IBM Research

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 168 - 169
Copyright
Copyright © Microscopy Society of America 2010