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Multilayer Laue Lenses (MLL) with 45 mm Focal Length as Optics for In-situ Nanoindentation Experiments

Published online by Cambridge University Press:  10 August 2018

Adam Kubec ,
Sven Niese ,
Jurgen Gluch ,
Martin Rosenthal ,
Juraj Todt ,
Jozef Keckes  and
Peter Gawlitza
Adam Kubec
Affiliation:
Fraunhofer IWS Dresden, EUV- and X-ray Optics, Dresden, Germany
Sven Niese
Affiliation:
AXO Dresden GmbH, Dresden, Germany
Jurgen Gluch
Affiliation:
Fraunhofer IKTS Dresden, Dresden, Germany
Martin Rosenthal
Affiliation:
ESRF, Microfocus Beamline ID13, Grenoble, France
Juraj Todt
Affiliation:
Erich Schmid Institute for Materials Science, Leoben, Austria
Jozef Keckes
Affiliation:
Erich Schmid Institute for Materials Science, Leoben, Austria
Peter Gawlitza*
Affiliation:
Fraunhofer IWS Dresden, EUV- and X-ray Optics, Dresden, Germany
*
*peter.gawlitza@iws.fraunhofer.de

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 436 - 437
Copyright
© Microscopy Society of America 2018 

References

References/ Acknowl edgement:

[1] Maser, J, et al, Proc. of SPIE 5539 2004) p. 185.Google Scholar
[2] Yan, H, et al, Phys. Rev. B 76 2007) p. 115438.Google Scholar
[3] Kubec, A, et al, J. Synchrotron Radiat. 21 2014) p. 1122.Google Scholar
[4] Niese, S, et al, Opt. Express 22.17 2014 20008–20013.Google Scholar
[5] Kubec, A, et al, Appl. Phys. Lett. 110(11 2017) p. 111905.Google Scholar
[6] Zeilinger, A, et al, Sci. Rep. 6 2016 22670.Google Scholar