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Morphology and Structure Anlysis of Graphene by Low Voltage TEM

Published online by Cambridge University Press:  27 August 2014

Youngji Cho
Affiliation:
Department of Measurement & Analysis, National Nanofab Center, Daejeon 305-701, Korea Department of Nano Semiconductor Engineering, Korea Maritime and Ocean University, Busan 606-791, Korea
Jun-Mo Yang
Affiliation:
Department of Measurement & Analysis, National Nanofab Center, Daejeon 305-701, Korea
Do Van Lam
Affiliation:
Nano-Mechanical Systems Research Division, Korea Institute of Machinery & Materials (KIMM), Daejeon 305-343, Korea
Seung-Mo Lee
Affiliation:
Nano-Mechanical Systems Research Division, Korea Institute of Machinery & Materials (KIMM), Daejeon 305-343, Korea
Jae-Hyun Kim
Affiliation:
Nano-Mechanical Systems Research Division, Korea Institute of Machinery & Materials (KIMM), Daejeon 305-343, Korea
Yun Chang Park
Affiliation:
Nano-Mechanical Systems Research Division, Korea Institute of Machinery & Materials (KIMM), Daejeon 305-343, Korea
Jiho Chang
Affiliation:
Department of Nano Semiconductor Engineering, Korea Maritime and Ocean University, Busan 606-791, Korea
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Abstract

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Copyright © Microscopy Society of America 2014 

References

[1] Booth, T., et al., Nano Lett. 8 (2008), p. 2442.
[2] Ferrari, A., et al., Phys. Rev. Lett. 97 (2006), p. 187401.
[3] Odom, T., et al., Nature 391 (1998), p. 92.
[4] Tsen, , et al., Science 336 (2012), p. 1143.
[5] Hernandez, Y., et al., Nature Nanotech. 3 (2008), p. 563.
[6] This research was supported by the MSIP (Ministry of Science, ICT&Future Planning), Korea, under the ITRC (Information Technology Research Center) support program supervised by the NIPA (National IT Industry Promotion Agency) (NIPA-2013-H0301-13-2009).
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